Impact of Elliptical Cross-Section on Some Electrical Properties of Gate-All-Around MOSFETs

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Impact of Elliptical Cross-Section on Some Electrical Properties of Gate-All-Around MOSFETs

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ژورنال

عنوان ژورنال: Bonfring International Journal of Power Systems and Integrated Circuits

سال: 2012

ISSN: 2250-1088,2277-5072

DOI: 10.9756/bijpsic.3139